时间:2016年9月14日14:00-15:30
地点:国家发展研究院万众楼一楼小教室
主讲人:Philipp Boeing, Centre of European Economic Research (ZEW)
Title: Measuring Patent Quality and National Technological Capacity in Cross-country Comparison
Abstract: China recently surpassed the USA as the greatest global source of patent applications. However, without internationally comparable measures of patent quality it remains questionable whether China’s patent expansion constitutes the rise of a new technological superpower. Our novel quality index is based on citations from international search reports and provides internationally comparable, quality-adjusted figures for applications made under the Patent Cooperation Treaty (PCT). We show that China’s patent expansion has taken place to the detriment of patent
quality. Weighting national PCT counts with our index reveals a widening gap between the technological capacities of China and the leading USA.